Spectral ellipsometry of nickel oxide films

Please use this identifier to cite or link to this item: https://rep.vsu.by/handle/123456789/35828

Title:	Spectral ellipsometry of nickel oxide films
Authors:	Rui, Z.
Keywords:	spectral ellipsometry оксид никеля спектральная эллипсометрия optical constants thin films nickel oxide
Issue Date:	2022
Publisher:	Витебск : ВГУ имени П. М. Машерова
Citation:	Rui, Z. Spectral ellipsometry of nickel oxide films / Z. Rui // The Youth of the 21st Century: Education, Science, Innovations : Proceedings of IX International Conference for Students, Postgraduates and Young Scientists, Vitebsk, December 9, 2022. – Vitebsk : VSU named after P. M. Masherov, 2022. – P. 27–29. – Bibliogr.: p. 29 (3 nam.).
Abstract:	Nickel oxide (NiO) is used to create photovoltaic solar cells, which has unique optical and electrical properties, as well as good chemical stability. It is necessary to develop technological regimes for obtaining thin NiO films with optimal characteristics for their use in photovoltaics.
URI:	https://rep.vsu.by/handle/123456789/35828
ISBN:	978-985-517-981-9
Appears in Collections:	The Youth of the 21st Century: Education, Science, Innovations : Proceedings of IX International Conference for Students, Postgraduates and Young Scientists, Vitebsk, December 9, 2022. – Vitebsk : VSU named after P. M. Masherov, 2022. – 402 р.