Spectral ellipsometry of nickel oxide films

Rui, Z.

Please use this identifier to cite or link to this item: https://rep.vsu.by/handle/123456789/35828

Full metadata record

DC Field	Value	Language
dc.contributor.author	Rui, Z.	-
dc.date.accessioned	2022-12-19T15:35:03Z	-
dc.date.available	2022-12-19T15:35:03Z	-
dc.date.issued	2022	-
dc.identifier.citation	Rui, Z. Spectral ellipsometry of nickel oxide films / Z. Rui // The Youth of the 21st Century: Education, Science, Innovations : Proceedings of IX International Conference for Students, Postgraduates and Young Scientists, Vitebsk, December 9, 2022. – Vitebsk : VSU named after P. M. Masherov, 2022. – P. 27–29. – Bibliogr.: p. 29 (3 nam.).	ru_RU
dc.identifier.isbn	978-985-517-981-9	-
dc.identifier.other	21a920e49d0c0fc9f345a6aff6d0df3a	-
dc.identifier.uri	https://rep.vsu.by/handle/123456789/35828	-
dc.description.abstract	Nickel oxide (NiO) is used to create photovoltaic solar cells, which has unique optical and electrical properties, as well as good chemical stability. It is necessary to develop technological regimes for obtaining thin NiO films with optimal characteristics for their use in photovoltaics.	ru_RU
dc.language.iso	en	ru_RU
dc.publisher	Витебск : ВГУ имени П. М. Машерова	ru_RU
dc.subject	spectral ellipsometry	ru_RU
dc.subject	оксид никеля	ru_RU
dc.subject	спектральная эллипсометрия	ru_RU
dc.subject	optical constants	ru_RU
dc.subject	thin films	ru_RU
dc.subject	nickel oxide	ru_RU
dc.title	Spectral ellipsometry of nickel oxide films	ru_RU
dc.type	Article	ru_RU
Appears in Collections:	The Youth of the 21st Century: Education, Science, Innovations : Proceedings of IX International Conference for Students, Postgraduates and Young Scientists, Vitebsk, December 9, 2022. – Vitebsk : VSU named after P. M. Masherov, 2022. – 402 р.